Deformation-induced effects in indium antimonide microstructures at cryogenic temperatures for sensor applications
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چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Технология и конструирование в электронной аппаратуре
سال: 2019
ISSN: 2309-9992,2225-5818
DOI: 10.15222/tkea2019.3-4.03